Invited Speakers


Anuj

Prof. Dr. Anuj Srivastava

Fellow, Inst. of Electrical and Electronic Engineers (IEEE)

Fellow, American Statistical Association (ASA)

Fellow, Intern. Assoc. for Pattern Recognition (IAPR)

Professor, Department of Statistics, Distinguished Research Professor

Florida State University, Statistical Shape Analysis and Modeling Group (SSAMG)


Title - Functional and Shape Data Analysis

Description - Functional and shape data analysis are important research areas, due to their broad applications across many disciplines. An essential component in solving them is the registration of points across functional objects. Without proper registration the results are often inferior and difficult to interpret. The current practice in functional data analysis and shape communities is to treat registration as a pre-processing step, using off-the-shelf alignment procedures, and follow it up with statistical analysis of the resulting data. In contrast, an elastic framework is a more comprehensive approach, where one solves for the registration and statistical inferences in a simultaneous fashion. The key idea here is to use Riemannian metrics with appropriate invariance properties, to form objective functions for alignment and to develop statistical models involving functional data. While these elastic metrics are complicated in general, we have developed a family of square-root transformations that map these metrics into simpler Euclidean metrics, thus enabling more standard statistical procedures. Specifically, we have developed techniques for elastic functional PCA and elastic regression models involving functional variables. This course will demonstrate these ideas using imaging data in neuroscience where anatomical structures can often be represented as functions (curves or surfaces) on intervals or spheres. Examples of curves include DTI fiber tracts and sulcal folds while examples of surfaces include subcortical structures (hippocampus, thalamus, putamen, etc). Statistical goals here include shape analysis and modeling of these structures and to use their shapes in medical diagnosis. As an extension, we will also cover shape analysis of 3D objects by considering shapes of their boundaries (surfaces). A prominent example of this kind of data is full body scans of humans, and we will discuss elastic shape analysis of human body shapes.


Josef

Prof. Dr. Josef Börcsök

Head of the department of computer architecture and system programming, University of Kassel, Germany


Title - Functional Safety in Cyber-Physical Systems

Description - Since the fabrication of the first integrated circuit in 1958 by Jack Kilby, its complexity has been increased over the last decades to achieve multiple functionalities from compact and miniaturized devices. For example, the first Microprocessors Intel 4004 (1971) had 2,300 Transistors within an area of 12 mm² while the new versions of Intel processors have billions of transistors per mm². Such integrated circuits are embedded in most of the daily used devices starting from washing machine, fridge, TV, cars, and planes. One of the essential systems that support the developments in future technology such as Industry 4.0 is the Cyber Physical Systems (CPSs). CPSs are merging the physical and the virtual worlds not only in the industrial applications, but also in automotive, avionics, medical monitoring, smart homes and robotics. As a result of the compactness of integrated circuits, the random hardware failures increase. Systematic failures, which are mainly the human errors in hardware design, production or maintenance or software errors, are also increased. The occurrence of these failures reduces the availability of the system and increases the hazards of human death or injury, property loss or environmental disasters. To prevent or mitigate the hazards related to the malfunction of the electrical, electronic and programmable electronic systems, the concept of “Functional Safety” has been established by International Electrotechnical Committee Advisory Committee of Safety (IEC ACOS) in 1980s. Based on this work, the IEC61508 standard has been born in 1997. This standard describes the life cycle of developing electrical, electronic and programmable electronic systems that are used in safety-critical systems. Various international norms and standards have been developed to cover a variety of applications such as process industry, robotics, automotive, and railway ( IEC61511, IEC62061 ISO26262, etc.).

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